Feature-oriented Scanning
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Feature-oriented scanning (FOS) is a method of precision measurement of surface topography with a
scanning probe microscope Scan may refer to: Acronyms * Schedules for Clinical Assessment in Neuropsychiatry (SCAN), a psychiatric diagnostic tool developed by WHO * Shared Check Authorization Network (SCAN), a database of bad check writers and collection agency for bad ...
in which surface features (objects) are used as reference points for microscope probe attachment. With FOS method, by passing from one surface feature to another located nearby, the relative distance between the features and the feature neighborhood topographies are measured. This approach allows to scan an intended area of a surface by parts and then reconstruct the whole image from the obtained fragments. Beside the mentioned, it is acceptable to use another name for the method – object-oriented scanning (OOS). __TOC__


Topography

Any topography element that looks like a hill or a pit in wide sense may be taken as a surface feature. Examples of surface features (objects) are:
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grains A grain is a small, hard, dry fruit (caryopsis) – with or without an attached hull layer – harvested for human or animal consumption. A grain crop is a grain-producing plant. The two main types of commercial grain crops are cereals and legumes ...
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nanoparticle A nanoparticle or ultrafine particle is usually defined as a particle of matter that is between 1 and 100 nanometres (nm) in diameter. The term is sometimes used for larger particles, up to 500 nm, or fibers and tubes that are less than 1 ...
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s, cells, etc. FOS is designed for high-precision measurement of surface topography (see Fig.) as well as other surface properties and characteristics. Moreover, in comparison with the conventional scanning, FOS allows obtaining a higher spatial resolution. Thanks to a number of techniques embedded in FOS, the distortions caused by thermal drifts and creeps are practically eliminated.


Applications

FOS has the following fields of application: surface
metrology Metrology is the scientific study of measurement. It establishes a common understanding of units, crucial in linking human activities. Modern metrology has its roots in the French Revolution's political motivation to standardise units in Fran ...
, precise probe positioning, automatic surface characterization, automatic surface modification/stimulation, automatic manipulation of nanoobjects, nanotechnological processes of “bottom-up” assembly, coordinated control of analytical and technological probes in multiprobe instruments, control of atomic/molecular assemblers, control of probe nanolithographs, etc.


See also

*
Counter-scanning Counter-scanning (CS) is a scanning method that allows correcting raster distortions caused by drift of the probe of scanning microscope relative to the measured surface. During counter-scanning two surface scans, viz., direct scan and counter scan ...
*
Feature-oriented positioning Feature-oriented positioning (FOP) is a method of precise movement of the scanning microscope probe across the surface under investigation. With this method, surface features (objects) are used as reference points for microscope probe attachment. A ...


References

1.
Russian translation
is available). 2.
Russian translation
is available). 3. 4. (in Russian). 5. 6. 7. 8. 9. 10. 11. 12.


External links



Research section, Lapshin's Personal Page on SPM & Nanotechnology {{Scanning probe microscopy Microscopes Nanotechnology